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Heejoo Choi
Associate Research Professor, Optical Sciences
James C Wyant Coll Optical Sci
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Overview
Research
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Collaboration
(13)
Daewook Kim
Mutual work: 10 Proposals﹒8 Grants﹒1 Publication
Collaboration Details
Christopher Walker
Mutual work: 1 Proposal﹒1 Publication
Collaboration Details
Dan Marrone
Mutual work: 1 Proposal
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Craig Kulesa
Mutual work: 1 Proposal
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Yuzuru Takashima
Mutual work: 1 Proposal﹒2 Publications
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Grants
(8)
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Publications
(69)
Recent
RIFTA: A Robust Iterative Fourier Transform-based dwell time Algorithm for ultra-precision ion beam figuring of synchrotron mirrors
2020
algorithm,
ion beam,
fourier transform,
ultra precision,
synchrotron mirrors
Full-aperture optical metrology for inflatable membrane mirrors
2020
optical metrology,
inflatable mirrors,
membrane mirrors,
optical measurement,
space optics
Thermally formed inflatable reflectors for space telescopes
2020
space telescopes,
inflatable structures,
thermal management,
reflective surfaces,
aerospace engineering
Hyperion: Far-UV cross dispersion spectroscope design
2020
spectroscopy,
far uv,
instrumentation,
cross dispersion,
design
Angular and spatial light modulation by single digital micromirror device for beam and pattern steering
2020
optical engineering,
photonics,
digital micromirror devices,
spatial light modulation,
beam steering
Disruptive space telescope concepts, designs, and developments: OASIS and Nautilus-INVITED
2020
space telescopes,
disruptive technology,
concept designs,
innovative developments,
oasis and nautilus
Interference of two diverging beams reflected from a plane parallel plate: stationary fringes with characteristic stable period
2020
interference,
optics,
wave phenomena,
beam reflection,
plate geometry
In-process metrology for segmented optics UV curing control
2020
metrology,
optics,
uv curing,
segmented optics,
control systems
Non-planar illumination sources for deflectometry
2020
deflectometry,
illumination sources,
non-planar surfaces,
surface inspection,
optical metrology
Computational alignment of on-machine deflectometry
2020
computational alignment,
on-machine deflectometry,
machine vision,
surface metrology,
optical inspection